Safire Scientific Company
Safire Scientific Company
R. S. Puram, Coimbatore, Tamil Nadu
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Physics And Material Science Lab Experiments

We are engaged in manufacturing of complete laboratory experiments measuring instruments for BS and MS laboratories of Physics , Electronics & Electrical Engineering . We are reputed for our quality products and excellent after sales support.

We have been catering to the needs of over 700 institutions in India and abroad since 1979. We, while orienting ourselves to the need of laboratories have been trying our best to develop and introduce progressively more advanced laboratory experiments and general-purpose measuring instruments.

This website highlights some of our manufacturing activities. The technical specifications given here are meant to give an accurate statement of performance of instruments manufactured by us.

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X Ray Diffraction Simulation Experiment
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X Ray Diffraction Simulation Experiment

Approx. Price: Rs 23,750 / Set(s)Get Latest Price
X-Ray Diffraction Simulation

Identification of Lattice and Determination of Lattice Constant by X-Ray DiffractionSimulation

IntroductionRegular arrangement of atoms in molecules and extended solids is very common. In crystalline solids theatoms are arranged in repeating three-dimensional arrays or lattices. Information regarding atomic bonddistances and angles is fundamental to understanding the chemical and physical properties of materials. Sinceatomic dimensions are of the order of angstroms (10 m), unraveling the relative atomic positions of a solidrequires a physical technique that operates on a similar spatial scale, Diffraction experiments involving X-ray,electron and neutron sources have therefore played a very crucial role in unraveling these structures. Thesignificance of these experiments in science and engineering courses has been recognized. However, the costof the equipment and the hazards associated with these experiments have made them very difficult to beintegrated and included in a teaching laboratory setting.The present set-up overcomes these limitations. An increase in scale by thousands from short wavelengths ofX-rays to the long wavelengths of visible light, and by hundreds of thousands from an array of atoms in acrystal or an extended solid to an array of dots, allows us to replicate the basic features of a structuraldetermination experiment in a teaching laboratory.In place of Bragg diffraction whose results are to be simulated, we use Fraunhofer diffraction. Visible laser lightpasses through an array of scattering centers (dots) on a 35 mm slide. The diffraction pattern is viewed atwhat is effectively infinite distance (a meter or so). This arrangement is capable of illustrating many of theessential features of the standard X-ray experiment. Mathematically, the equations for Fraunhofer and Braggdiffraction have a similar functional dependence on the interatomic distance, wavelength and the scatteringangle. The symmetry of the diffraction pattern is same as the symmetry of the lattice causing the diffraction.The central piece of the set-up is a slide (transparency) with eight (A-H) different arrangements of scatteringcenters (dots) on different portions of the slide (Figure 3). The examples presented here serve to illustratehow the spacings, symmetries, spot intensities and systematic absences in a diffraction pattern are related tothe lattice from which it is derived. Although these are two-dimensional lattices, they mimic what would beobserved for diffraction from particular three-dimensional structures that are viewed in projectionperpendicular to a face.
SetupA battery operated laser mounted on a stand is put at one end of anoptical bench. The slide is mounted on another stand (Figure 1)which is kept at about 10-20 cm away from the laser such that thelaser light falls normally on the slide. The slide on this stand can bemoved sideways and vertically so that the laser light falls ondifferent portions of the slide. The diffraction pattern is observed ona perspex screen (Figure 2) fixed normal to the laser light at theother end of the optical bench. The whole set-up is put in adarkened room where the experiment is performed.
AimThe basic aim of the experiment is to identify the lattice and to determine its lattice constant.

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Zeeman Effect Experiment
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Zeeman Effect Experiment

Approx. Price: Rs 1.63 Lakh / Set(s)Get Latest Price
ZEEMAN EFFECT EXPERIMENT

INTRODUCTION

The Zeeman effect is the splitting of spectral lines of atoms when they are placed in a magnetic field. It exhibits space quantization and is one of the few fundamental atomic physics experiments which can be performed in a teaching laboratory.

Description of the experimental setup

Experimentental Set-up for Zeeman Experiment

The set-up consists of the following:

1. High Resolution Fabry Perot Etalon, FP-01
2. Mercury Discharge Tube, MT-01 (Low Pressure Mercury Discharge Tube)
3. Power Supply for MT-01, MTPS-01 (H.V. Power Supply for Discharge Tube)
4. Narrow Band Interference Filter, IF-01

Specifications

Central Wave Length546nm
Tmax74%
HBW8nm

5. Polarizer with lens, PL-01
6. Optical Bench: OB-01
7. CCD Camera: CCD-01 (High Resolution CCD Camera)
8. Telescope with Focussing Lens: FL-01
9. Monitor 14”: TV-14
10. Electromagnet, EMU-50T
11. Constant Current Power Supply, DPS-50

12. Digital Gaussmeter, DGM-102

The experimental set-up is complete in all respect

Result

The interference pattern is in the form of circular rings. These are split when the magnetic field is switched on. The amount of splitting depends on the external magnetic field, charge to mass ratio of electron and Lande’s g-factors of the electronic energy levels involved in the transition. These later quantities can be obtained from this experiment.

The result of this unit are within 5% of the standard value.

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Measurement Of Susceptibility Of Solids By Gouy's Method
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Measurement Of Susceptibility Of Solids By Gouy's Method

Approx. Price: Rs 1.99 Lakh / Set(s)Get Latest Price
MEASUREMENT OF SUSCEPTIBILITY OF SOLIDS BY GOUY'S METHOD

Apparatus for Measurement of Susceptibility of Paramagnetic Solids by Gouy’s Method

In the Gouy’s method of susceptibility measurement, the solid sample in the form of a long cylinder (area of cross section A) is hung from the pan of a balance and is placed such that one end of the sample is between the pole-pieces of the magnet (field H) and the other one is outside the field. The force exerted on the
sample by the inhomogeneous magnetic field is obtained by measuring the apparent change ( m ) in the mass of the sample. The susceptibility is given by

c = 2 mg/AH2


If the sample is in the form of powder, it is filled in a long nonmagnetic tube which is then suspended from the pan of the balance.

The set up consists of the following:

a) Digital Balance, ATY224 SHIMADZU JAPAN

Capacity2200 gms
Readability0.0001 gms
Repeatability± 0.1 mg
Linearity± 0.2 mg
Pan Size± 90mm
StandardBidirectional RS-232 interface
Special FeatureWeight below hook for GMX-02

b) Sample in the form of a long rod

Aluminium sample and Glass Tube

c) Electromagnet, Model EMU-75T

Pole Peice75mm tappered to 25mm
Mag. Field20KG at 6mm airgap
Energising CoilsTwo of approx. 13Weach
Power0-90Vdc, 3A, for coils in series
0-45Vdc, 6A, for coils in parallel

d) Constant Current Power Supply, Model : DPS-175

e) Digital Gaussmeter, Model : DGM-202

f) GMX-02 Trolley, Model, GMX-TR2

 

 

The experiment is complete in all respect

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Measurement Of Magneto Resistance In Bismuth
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Measurement Of Magneto Resistance In Bismuth

Approx. Price: Rs 1.34 Lakh / SETGet Latest Price
MEASUREMENT OF MAGNETO RESISTANCE IN BISMUTH

Measurement of Magnetoresistance in Bismuth

It is noticed that the resistance of the sample changes when the magnetic field is turned on. The phenomenon, called magnetoresistance, is due to the fact that the drift velocity of all the carriers is not same. With the magnetic field on; the Hall voltage V = Eyt =|v × H| compensates exactly the Lorentz force for carriers with the average velocity; slower carriers will be over compensated and faster one undercompensated, resulting in trajectories that are not along the applied field. This results in an effective decrease of the mean free path and hence an increase in resistivity.

Here the above referred symbols are defined as: v = drift velocity; E = applied electric field; t = thickness of the crystal; H = Magnetic field

EXPERIMENTENTAL SET-UP FOR MAGNETORESISTANCE

The set-up consists of the following:
1.Hall Probe: Bismuth
2.Constant Current Source, CCS-01
3.Digital Microvoltmeter, DMV-001
4.Electromagnet, EMU-75
5.Constant Current Power Supply, DPS-175

6.Digital Gaussmeter, DGM-102

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High Temperature Two Probe Set Up
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High Temperature Two Probe Set Up

Approx. Price: Rs 1.19 Lakh / Set(s)Get Latest Price
HIGH TEMPERATURE TWO PROBE SET UP

Two Probe Method For Resistivity Measurement of Near Insulators at Different Temperatures (Ambient to 6000C) with computer interfacing facility

DESCRIPTION

Behaviour of resistivity of substarte such as polymer sheets/ films at higher temperatures is an important area of investigation due to their variety of applications. Two Probe Method is one of the standard and most commonly used method for the measurement of resistivity of very high resistivity samples like sheets/films of polymers. The resistivity measurement of such samples is beyond the range of Four Probe Method.

DESCRIPTION OF THE EXPERIMENTAL SET-UP

1. Two Probes Arrangement

It has two individually spring loaded probes. The probes arrangement is mounted in a suitable stand of high quality alumina which also holds the sample plate. To ensure the correct measurement of sample temperature, the thermocouple junction is embedded in the sample plate just below the sample. This stand also serves as the lid of temperature controlled oven. Proper leads are provided for connection to Capacitance Meter and Temperature Controller.

2. High Temperature Oven

This is a high quality temperature controlled oven. The heating element used is a high grade KanthalD. It is mounted on a custom made groved, sintered alumina fixture to avoid any slippage of heating wire. Heat shield is also provided to reduce the excessive heating of outer cover. Further the top portion is also suitably covered to meet the safety standard. The oven has been designed for fast heating and cooling rates, which enhances the effectiveness of the controller.

3. PID Temperature Controller

The unit is a high quality PID controller wherein the temperatures can be set and controlled easily. The P, I and D parameters are factory set for immediate use however the user may adjust these for specific applications as well as auto-tune the oven whenever required. The steps for these are given in the user manual. Although the controller may be used either for our small oven, up to 200°C or a larger oven up to 600°C, however, in the present setup only large oven is to be used. The controller uses thermocouple as temperature sensor.


4. High Voltage Power Supply, Model EHT-11C

5. Digital Picoammeter, Model DPM-111C

6. Computer Interface, SES-CAMM

The experimental set-up is complete in all respect


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General Physics Laboratory Instruments
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General Physics Laboratory Instruments

Approx. Price: Rs 1,500 / PieceGet Latest Price
GENERAL PHYSICS LABORATORY INSTRUMETNS - PART I/II

1a. Digital D.C. Microvoltmeter, Model DMV-001

1b. Digital D.C. Microvoltmeter, Model DMV-001-C2

(with USB based computer interface and software; also compatible with SES-CAMM)

2a. Digital Nanoammeter, Model DNM-121

2b. Digital Nanoammeter, Model DNM-121-C2

(with USB based computer interface and software; also compatible with SES-CAMM)

3a. Digital Picoammeter, Model DPM-111

3b. Digital Picoammeter, Model DPM-111-C2

(with USB based computer interface and software; also compatible with SES-CAMM)

4a. High Voltage Power Supply, Model EHT-11

4b. High Voltage Power Supply, Model EHT-11-C1

(compatible with SES-CAMM unit, for use in computerised version of our experiments)

5. (a) True RMS A.C. Millivoltmeter, Model ACM-102

(Range:0- 20mV, 0-200mV, 0-2V & 0-20V)

(b) True RMS A.C. Millivoltmeter, Model ACM-103

(Same as above but with built in 1KHz oscillator)

6. (i) (a) Electromagnet, Model EMU-75

(pole pieces 75mm flat, 11KG at 10mm air gap)

(b) Electromagnet, Model EMU-75T

(pole pieces tapered from 75mm to 25mm, 14KG at 10mm air gap)

(ii) (a) Constant Current Power Supply, Model DPS-175M

(microcontroller based power supply, suitable for long duration operation with EMU-75/ 75T)

(b) Constant Current Power Supply, Model DPS-175-C2

(with multiple control/ interface options: Manual; External; USB; SES-CAMM)

(c) Constant Current Power Supply (Biopolar), Model DPS-175BP

7. (i) (a) Electromagnet, Model EMU-50V

(pole pieces 50mm flat, 7.5KG at 10mm air gap)

(b) Electromagnet, Model EMU-50T

(pole pieces tapered from 50mm to 25mm, 9KG at 10mm air gap)

(ii) (a) Constant Current Power supply, Model DPS-50

(b) Constant Current Power supply, Model DPS-50-C1

(compatible with SES-CAMM unit, for use in computerised version of our experiments)

8. Digital Gaussmeter, Model DGM-102 (Range:0- 2KG & 0-20KG)

9a. Digital Gaussmeter, Model DGM-202

(Range: 0-2KG & 0-20KG; interchangeable Hall Probe)

9b. Digital Gaussmeter, Model DGM-202-C1

(compatible with SES-CAMM unit, for use in computerised version of our experiments)

10. Digital Gaussmeter, Model DGM-103

(Range: 0-2KG, 0-20KG & 0-40KG; with differential mode facility)




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General Physics Laboratory Instruments Part II
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General Physics Laboratory Instruments Part II

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GENERAL PHYSICS LABORATORY INSTRUMENTS PART II

11a. Digital Gaussmeter, Model DGM-204

(Range: 0-0.2KG, 0-2KG , 0-20KG & 0-40KG; interchangeable Hall Probe)

11b. Digital Gaussmeter, Model DGM-204-C2

(with USB based computer interface and software; also compatible with SES-CAMM)

12. Hand Held Gaussmeter, Model DGM-HH-01

13a. PID Controlled Oven, PID-TZ/ PID-TZ-CT

(PID-TZ is general purpose, versatile, high performance PID controlled oven controller

coupled with 200°C oven unit (RM-Oven-200) suitable for DFP-RM-200/ TPX-200.

PID-TZ-CT is modified to make the above Oven suitable for component testing (CT-Oven-

200)

13b. PID Controlled Oven, PID-TZ-C1

(suitable for TPX-01C, compatible with SES-CAMM unit, for use in computerised version of

our experiments)

14. Travelling Microscope, TVM-02

(2-way screw gauge type motion with large dial)

15. Travelling Microscope, TVM-03

(3-way motion - 2 screw gauge type and 1 vernier type)

16. Digital Microscope, DMS-01

(Resolution: 1.3M pixels (1280* 1024 pixels); adjustable magnification 10x~230x; interface:

USB 2.0; Built-in 8 switchable Led for illumination; Instant picture snapshots and time-lapse,

video recording; Measurement software: measure images by length, angle, area, etc.)

17. Regulated Power Supply, Model PS-12 (±12V & ± 5V)

18. Function Generator, Model: FG-01

(10Hz-2MHz; Square/Sine/ Triangular; Amplitude 0-3V (p-p))


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Physics And Material Science Lab Experiments Part I
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Physics And Material Science Lab Experiments Part I

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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART I

YSICS AND MATERIAL SCIENCE LAB EXPERIMENTS

19. X-Ray Diffraction Simulation Experiment, XDE-01

Complete in all respect

20. Magnetic Field Measurement Apparatus, MFM-01

Study of magnetic field of a current carrying coil and determination of its radius. And study of

superimposition of magnetic fields generated by two coils at different positions

Complete in all respect

21. Study of Dielectric Constant and Curie Temperature of

Ferroelectric Ceramics, DEC-01

Complete in all respect

22. Dielectric Constant of Liquids, Model DCL-01

Dielectric measurements of non conducting liquids. Complete in all respect

23. Dielectric Measurement Setup, DEC-600

Suitable for temperature upto 600°C, including highly stable PID Controller and Capacitance

meter 1pF to 20000μF.

24. Zeeman Effect Experiment, ZEX-01

Complete in all respect including 14” LCD Flat Panel monitor and CCD Camera

25. Millikan’s Oil Drop Experiment, MOD-01 (LCD TV)

Measurement of electron charge by Millikan’s Experiment. The experiment comes complete

with 14” LCD Flat Panel monitor, timer, atomizer etc. The oil droplets can be seen on monitor

ensuring convenience & accuracy.

26. e/m Experiment, EMX-01

Measurement of electron charge to mass ratio, based on Thomson’s method.

Complete in all respect

27. Planck’s Constant by Photoelectric Effect, PC-101

Complete in all respect

28. Determination of Planck’s Constant by means of LED’s, PCA-01

The method is based on well known expression of diode current for V

current with temperature is measured, keeping the V slightly below V0 and material constant h is

obtained from V-I characteristics of the diode. Complete in all respect

29. Frank Hertz Experiment, FH-3001

Complete in all respect, but a oscilloscope will be helpful

30. Ionisation Potential Set-up, IP-01

Complete in all respect, but a oscilloscope will be helpful

31. Resistivity of Semiconductors by Four Probe Method at Different Temperatures and

Determination of the Band-gap, DFP-02 (Basic Model)

Complete in all respect

32. Resistivity of Semiconductors by Four Probe Method at Different Temperatures and

Determination of the Band-gap, DFP-03 (Advance Model)

Complete in all respect


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Physics and Material Science Lab Experiments Part II
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Physics and Material Science Lab Experiments Part II

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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART II

33. Four Probe set-up for measuring the resistivity of very low to highly resistive samples

at temperatures upto 200ºC with PID controlled oven, DFP-RM-200 (Research Model)

The set-up consists of the following

(i) Four Probe Arrangement with built-in thermocouple sensor, FPA-RM-200

(ii) Standard Samples: Ge, Si and Aluminium

(iii) Oven Unit (upto 200C), RM-Oven-200

(iv) High Performance PID Controller, PID-TZ

(v) D.C. Microvoltmeter, DMV-001

(vi) Constant Current Source, CCS-01 (Range: 0-20mA & 0-200mA)

For low resistivity samples like thin films of metals and alloys

(vii) Low Current Source, LCS-02

(Range: 0-2μA, 0-20μA, 0-200μA & 0-2mA) For highly resistive samples

Complete in all respect

34. Four Probe Set-up for Mapping the Resistivity of Large Samples, FP-01

(Mapping Model)

The set-up consists of the following

(i) Four Probe Arrangement with X-Y movement and vernier scales, FPA-FP-01

(ii) Standard Samples: Ge, Si and Aluminium

(iii) D.C. Microvoltmeter, DMV-001

(iv) Constant Current Source, CCS-01 (Range: 0-20mA & 0-200mA)

For low resistivity samples like thin films of metals and alloys

(v) Low Current Source, LCS-02

(Range: 0-2μA; 0-20μA; 0-200μA; 0-2mA) For highly resistive samples

Complete in all respect.

35. Measurement of Magnetoresistance of Semiconductors, MRX-01

The set-up consists of following units: (Breakup)

(i) Four Probe Arrangement, FPA-MRX-01 3200.00

(ii) Sample: Ge Crystal (n-type) _1600.00

(iii) Hall Probe Multipurpose Stand, HPS 900.00

(iv) Magnetoresistance Setup, DMR-01 6800.00

(v) Electromagnet, EMU-50V 25500.00

(vi) Constant Current Power Supply, DPS-50 11500.00

(vii) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9)

Complete in all respect

36. Measurement of Magnetoresistance in Bismuth, MRB-11

The set-up consists of following units: (Breakup)

(i) Four Probe Arrangement, FPA-MRB-11

(ii) Sample: Bismuth

(iii) Hall Probe Multipurpose Stand, HPS

(iv) Constant Current Source, Model CCS-01

(v) Digital D.C. Microvoltmeter, Model DMV-001

(vi) Electromagnet, EMU-75

(vii) Constant Current Power Supply, DPS-175M

(viii) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9)

Complete in all respect


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Physics and Material Science Lab Experiments Part III
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Physics and Material Science Lab Experiments Part III

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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART III

37a. Two Probe Method for Resistivity Measurement of Insulators, TPX-200

(upto 1013W.cm.) at Different Temperatures

The set-up consists of the following

(i) Two Probe Arrangement with built-in thermocouple sensor, TPA-TPX-200

(ii) Test Sample: 50M resistance (not for experiment)

(iii) Oven Unit (upto 200°C), RM-Oven-200

(iv) High Performance PID Controller, PID-TZ

(v) High Voltage Power Supply, EHT-11

(vi) Digital Picoammeter, DPM-111

Complete in all respect.

37b. Two Probe Method for Resistivity Measurement of Insulators,TPX-200C

(upto 1013W.cm.) at Different Temperatures with USB based computer interface

The set-up consists of the following

(i) Two Probe Arrangement with built-in thermocouple sensor, TPA-TPX-200

(ii) Test Sample: 50M resistance (not for experiment)

(iii) Oven Unit (upto 200°C), RM-Oven-200

(iv) High Performance PID Controller with computer interface, PID-TZ-C1

(v) High Voltage Power Supply, EHT-11C

(vi) Digital Picoammeter, DPM-111C

(vii) Computer Aided Measurement Module, SES CAMM, complete with suitable software

Complete in all respect.

37c. High Temperature Two Probe Set-up, TPX-600

(Suitable for temperature upto 600°C, including highly stable PID Controller, 1500V EHT

Power Supply and high resolution Picoammeter)

The set-up consists of the following

(i) Two Probe Arrangement with built-in thermocouple sensor, TPA-TPX-600

(ii) Test Sample: 50M resistance (not for experiment)

(iii) Oven Unit (upto 600°C), RM-Oven-600

(iv) High Performance PID Controller, PID-TZ

(v) High Voltage Power Supply, EHT-11

(vi) Digital Picoammeter, DPM-111

Complete in all respect.

37d. High Temperature Two Probe Set-up, TPX-600C

with USB based computer interface facility

(Suitable for temperature upto 600°C, including highly stable PID Controller, 1500V EHT

Power Supply and high resolution Picoammeter)

The set-up consists of the following

(i) Two Probe Arrangement with built-in thermocouple sensor, TPA-TPX-600

(ii) Test Sample: 50M resistance (not for experiment)

(iii) Oven Unit (upto 600°C), RM-Oven-600

(iv) High Performance PID Controller with computer interface, PID-TZ-C1

(v) High Voltage Power Supply, EHT-11C

(vi) Digital Picoammeter, DPM-111C

(vii) Computer Aided Measurement Module, SES CAMM, complete with suitable software

Complete in all respect.

38. Electron Spin Resonance Spectrometer, ESR-105

Complete in all respect, except a oscilloscope

39. NMR Experiment, NMR-01

Complete in all respect, except a oscilloscope


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Physics And Material Science Lab Experiments Part Iv
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Physics And Material Science Lab Experiments Part Iv

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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART IV

40. Study of Thermoluminescence of F-centres in Alkali Halide Crystals, TLX-02 63700.00

The set-up consists of following units: (Breakup)

(a) Experimental set-up for creating the Thermoluminescence, TL-02

(Oven with power supply, digital thermometer, samples, black box etc.)

(b) For Measuring of Luminescence Intensity

1. Photomultiplier Tube-931A/ R11558

2. PMT Housing with biasing circuit

3. EHT Power Supply, Model EHT-11

4. Digital Nanoammeter, Model DNM-121

Complete in all respect, except XRF/ XRD facility, which is required to irradiate the sample.

Thermoluniscence Irradiation Unit, TEI-01 can also be used for sample preparation.

41. Thermoluminescence Irradiation Unit, TEI-02

(Irradiation unit suitable for irradiating alkali halide samples for thermoluniscence experiment)

Complete in all respect including vacuum pump and HV electric field generator

42. Hall Effect Experiment, HEX-21 0

The set-up consists of following units:

(i) (a) Hall Probe (Ge Crystal - n type)

(b) Hall Probe (Ge Crystal - p type)

(ii) Hall Probe Multipurpose Stand, HPS

(iii) Hall Effect Set-Up, Model DHE-21

(iv) Electromagnet, Model EMU-50V (Optional: EMU-75-Item no. 6ia)

(v) Constant Current Power Supply, DPS-50 (Optional: DPS-175M -Item no. 6iia)

(vi) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9a)

Complete in all respect

43. Hall Effect Experiment, HEX-21C

The set-up consists of following units: (Breakup)

(i) (a) Hall Probe (Ge Crystal - n type)

(b) Hall Probe (Ge Crystal - p type)

(ii) Hall Probe Multipurpose Stand, HPS

(iii) Hall Effect Set-Up, Model DHE-21C

(iv) Electromagnet, Model EMU-50V (Optional: EMU-75-Item no. 6ia)

(v) Constant Current Power Supply, DPS-50C (Optional: DPS-175C -Item no. 6iib)

(vi) Digital Gaussmeter, DGM-202C (Optional: DGM-204C-Item no.11b)

(vii) Computer Aided Measurement Module, SES CAMM-2, complete with suitable software

Complete in all respect

44. Hall Effect Experiment, HEX-Research

The set-up consists of following units: (Breakup)

(i) (a) Hall Probe (Ge Crystal - n type)

(b) Hall Probe (Ge Crystal - p type)

(c) Hall Probe Mount (For 10mmx10mm sample)

(c) Hall Probe Mount (For 5mmx50mm sample)

(ii) Hall Probe Multipurpose Stand, HPS – 2pcs

(iii) Digital Microvoltmeter, DMV-001

(iv) Constant Current Power Supply, CCS-01

(iv) Electromagnet, Model EMU-75T

(v) Constant Current Power Supply, DPS-175M

(vi) Digital Gaussmeter, DGM-202


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Physics and Material Science Lab Experiments Part V
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Physics and Material Science Lab Experiments Part V

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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART V

45. Hall Effect in Bismuth, HEB-11

The set-up consists of following units:

(i) Hall Probe : Bismuth

(ii) Multipurpose Stand

(iii) Digital Microvoltmeter, DMV-001

(iv) Constant Current Power Supply, CCS-01

(iv) Electromagnet, Model EMU-75

(v) Constant Current Power Supply, DPS-175M

(vi) Digital Gaussmeter, DGM-202

Complete in all respect

46. Hall Effect in Metals, HEM-01

The set-up consists of following units:

(i) (a) Hall Probe (Silver-Ag)

(b) Hall Probe (Tungsten-W)

(ii) Multipurpose Stand

(iii) High Current Power Supply, PS-20

(iv) Digital D.C. Microvoltmeter, DMV-001

(v) Electromagnet, Model EMU-75T

(vi) Constant Current Power Supply, DPS-175M

(vii) Digital Gaussmeter, DGM-202

Complete in all respect

47. Dependence of Hall Coefficient on Temperature, HEX-22

The set-up consists of following units:

(i) Hall Effect Setup, Model: DHE-22

(ii) Hall Probe (Ge : p-type) with a small oven and a Thermocouple

(iii) Hall Probe Multipurpose Stand, HPS

(iv) Electromagnet, Model EMU-50V (Optional: EMU-75-Item no. 6ia)

(v) Constant Current Power Supply, DPS-50 (Optional: DPS-175M -Item no. 6iia)

(vi) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9a)

Complete in all respect

48. Apparatus for the Measurement of Susceptibility of Paramagnetic Solution by Quinck's

Tube Method, QTX-01

The set-up consists of following units:

(i) Quinck's tube

(ii) Q-Tube multipurpose Stand, QTS

(iii) Sample : MnSO4.H2O

(iv) Travelling Microscope, TVM-02 (Optional: Digital Microscope – Item no. 15)

(v) Electromagnet, Model EMU-50T (Optional: EMU-75T-Item no. 6ib)

(vi) Constant Current Power Supply, DPS-50 (Optional: DPS-175M -Item no. 6iia)

(vii) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9)

Complete in all respect, except chemical balance.

49a Apparatus for the Measurement of Susceptibility of Solids by Gouy’s Method, GMX-01

(with EMU-75 & DPS-175M)*

(Suitable for different variety of samples)


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Physics and Material Science Lab Experiments Part Vi
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PHYSICS AND MATERIAL SCIENCE LAB EXPERIMENTS PART VI

49b Apparatus for the Measurement of Susceptibility of Solids by Gouy’s Method, GMX-01

(with EMU-50 & DPS-50)

(Suitable for classroom experiment)

The set-up consists of following units:

(i) Scientific Balance, KSB-07 (with weight box)

(ii) Al. Samples and Glass Tube for powder samples

(iii) Gouy’s Balance Stand

(iv) Electromagnet, Model EMU-75T * (with 49a)

(v) Constant Current Power Supply, DPS-175M * (with 49a)

(vi) Digital Gaussmeter, DGM-102 (Optional: DGM-202-Item no. 9a)

(iv) Electromagnet, Model EMU-50T (with 49b)

(v) Constant Current Power Supply, DPS-50 (with 49b)

Complete in all respect.

49c Apparatus for the Measurement of Susceptibility of Solids by Gouy’s Method, GMX-02

(with EMU-75T & DPS-175)*

49d Apparatus for the Measurement of Susceptibility of Solids by Gouy’s Method, GMX-02

(with EMU-50T & DPS-50)

(Suitable for different variety of samples)

The set-up consists of following units: (Breakup)

(i) Digital Balance, ATY224 SHIMADZU

(ii) Al. Samples and Glass Tube for powder samples

(iii) GMX-02 Trolley

(iv) Electromagnet, Model EMU-75T* (with 49c)

(v) Constant Current Power Supply, DPS-175M* (with 49c)

(vi) Digital Gaussmeter, DGM-202

(iv) Electromagnet, Model EMU-50T (with 49d)

(v) Constant Current Power Supply, DPS-50 (with 49d)

Complete in all respect.

50a. Magnetic Hysteresis Loop Tracer, HLT-111

Complete in all respect, except a oscilloscope.

50b. Magnetic Hysteresis Loop Tracer, HLT-111C

(USB based computer interface through SES CAMM. Complete in all respect with SES-CAMM

unit and software, except a oscilloscope)

51. Study of the energy band-gap and diffusion potential of P-N Junctions, PN-01

Complete in all respect, except a oscilloscope.

52. Study of Diode Characteristics, SDC-02

Study of Si, Ge, LED & Zener diodes. Direct measurement of Voltage & Current (100nA to

20mA) and provision for direct display of diode characteristics on oscilloscope

Complete in all respect, except a Oscilloscope


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PHYSICS AND ELECTRONICS EXPERIMENTAL SETUPS

53. Study of a Transistor Amplifier (RC Coupled) Cum-Feed Back Amplifier, Model: RC-01

Accessories required :

(i) Function Generator (Item no. 18) (ii) True RMS A.C. Millivoltmeter (Item no. 5a)

54. Study of Multivibrators, Model: MV-01

Complete in all respect, except a oscilloscope

55. Study of Characteristics of Semiconductors Diodes Si, Ge, Zener & LED, Model: D-1

Complete in all respect.

56. Study of Hybrid Parameters of Transistors, Model: HP-01

Accessories required : (i) True RMS A.C. Millivoltmeter with 1KHz. Oscillator (Item no. 5b)

57. Study of a Solid State Power Supply, Model: SSPS-02

Complete in all respect including electronic load and voltmeter/ ammeter

58. Study of Modulation & Demodulation with Built-in Carrier Frequency (Solid State),

Model: MD-01

Accessories required : (i) Function Generator (Item no. 18), (ii) Oscilloscope (N.M.)

59. Study of a Basic Operational Amplifier Type-74l, Model: 741-01

Complete in all respect

60. Study of Op Amp 74l Applications, Model: 741-03

Complete in all respect, including signal generator, regulated power supplies, multirange digital

voltmeter and patch chords, except a oscilloscope.

61. Study of Astable & Monostable Multivibrators using Timer IC, Model: 555

Complete in all respect, including power supply and a trigger, except a oscilloscope.

62. Study of an Integrated Circuit Regulator, Model: 723

Complete in all respect, including unregulated power supply, a voltmeter, an ammeter, variable load

resistance and patch chords.


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